Title :
Identification Methods And Conformance Testing
Author :
Baron, C. ; Geffroy, J.-C.
Author_Institution :
INSA-DGE
fDate :
30 Jun-1 Jul 1994
Keywords :
Automatic testing; Circuit testing; Context; Fault diagnosis; Neural networks; Protocols; Sequential analysis; Sequential circuits; Software testing; System testing;
Conference_Titel :
Test Workshop, 1994. ATW '94. The Third Annual Atlantic
DOI :
10.1109/ATW.1994.747827
