2593190

Functional Test Generation For finite State Machines With Concurrent Fault Simulation

Cooray, Niranjan I. ; Czeck, Edward W.

Northeastern University

1994

30 Jun-1 Jul 1994

Automata; Automatic testing; Circuit faults; Circuit testing; Computational modeling; Computer simulation; Costs; Electrical fault detection; Fault detection; Test pattern generators;

English

ieee

Test Workshop, 1994. ATW '94. The Third Annual Atlantic

conf

10.1109/ATW.1994.747832

747832