DocumentCode
2593208
Title
Near-optimal Test Sequencing Algorithms For Sequential Fault Diagnosisl
Author
Raghavan, Vijaya ; Pattipati, Krishna R.
Author_Institution
University of Connecticut
fYear
1994
fDate
30 Jun-1 Jul 1994
Keywords
Algorithm design and analysis; Cost function; Electronic mail; Fault diagnosis; Heuristic algorithms; Medical tests; Optimized production technology; Power generation economics; Sequential analysis; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Workshop, 1994. ATW '94. The Third Annual Atlantic
Type
conf
DOI
10.1109/ATW.1994.747834
Filename
747834
Link To Document