• DocumentCode
    2593218
  • Title

    Bayes reliability modeling of a multistate consecutive K-out-of-n: F system

  • Author

    Haim, M. ; Porat, Z.

  • Author_Institution
    RAFAEL, Haifa, Israel
  • fYear
    1991
  • fDate
    29-31 Jan 1991
  • Firstpage
    582
  • Lastpage
    586
  • Abstract
    A description is given of Bayes reliability modeling of a multistate consecutive K-out-of-n: F system, comprising independent identical multistate units, with Pc , a unit state probabilities vector. The mathematical expression for the conditional system unreliability (CSU) is derived by Markov chain. A Bayesian approach is adopted in order to reflect uncertainty in Pc. It is modeled by a Dirichlet distribution and propagated into CSU. The proposed model provides Bayes prediction tools for the mean values and confidence bounds of the system failure states probabilities
  • Keywords
    Bayes methods; probability; reliability; Bayes reliability modeling; Dirichlet distribution; Markov chain; comprising independent identical multistate units; conditional system unreliability; multistate consecutive K-out-of-n: F system; system failure states probabilities; uncertainty; unit state probabilities vector; Bayesian methods; Covariance matrix; Maintenance; Predictive models; Probability; Uncertainty; Virtual manufacturing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Reliability and Maintainability Symposium, 1991. Proceedings., Annual
  • Conference_Location
    Orlando, FL
  • Print_ISBN
    0-87942-661-6
  • Type

    conf

  • DOI
    10.1109/ARMS.1991.154502
  • Filename
    154502