DocumentCode :
2593268
Title :
Integration Of Comprehensive Testing In Microelectronics Curriculum
Author :
Prasad, Prof Kanti ; Goel, Prof Aditya
Author_Institution :
University of Massachusetts
fYear :
1994
fDate :
30 Jun-1 Jul 1994
Keywords :
Chemistry; Circuit testing; Computer science education; Educational institutions; Fabrication; Microelectronics; P-n junctions; Packaging; Physics education; Very large scale integration;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Test Workshop, 1994. ATW '94. The Third Annual Atlantic
Type :
conf
DOI :
10.1109/ATW.1994.747839
Filename :
747839
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2593268
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