DocumentCode
2593361
Title
The Register Optimization Step In A Self-testing High-level Synthesis Tool.
Author
Grimal, B. ; Martin, E.
Author_Institution
University of Rennes
fYear
1994
fDate
30 Jun-1 Jul 1994
Keywords
Automatic testing; Built-in self-test; Circuit testing; Constraint optimization; Cost function; Fault tolerance; High level synthesis; Optimization methods; Signal processing; Signal synthesis;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Workshop, 1994. ATW '94. The Third Annual Atlantic
Type
conf
DOI
10.1109/ATW.1994.747845
Filename
747845
Link To Document