DocumentCode
2593621
Title
The method for evaluating the probability of failures of digital devices under the influence of short electromagnetic pulses
Author
Parfenov, Yuri V. ; Radask, William A. ; Titov, Boris A. ; Zdoukhov, Leonid N.
Author_Institution
Joint Inst. for High Temps., Moscow, Russia
fYear
2012
fDate
21-24 May 2012
Firstpage
353
Lastpage
356
Abstract
The method for evaluating the immunity of digital devices to the influence of repetitive short electromagnetic pulses is proposed. This method makes it possible to choose the optimal characteristics of radiated pulses, and to predict the results of the influence of pulses with arbitrary parameters, etc.
Keywords
electromagnetic pulse; failure analysis; probability; arbitrary parameters; digital devices failures probability; digital devices immunity evaluation; optimal characteristics; radiated pulses; short electromagnetic pulses; Computational modeling; Computer networks; Computers; Data models; Microstrip; Wires;
fLanguage
English
Publisher
ieee
Conference_Titel
Electromagnetic Compatibility (APEMC), 2012 Asia-Pacific Symposium on
Conference_Location
Singapore
Print_ISBN
978-1-4577-1557-0
Electronic_ISBN
978-1-4577-1558-7
Type
conf
DOI
10.1109/APEMC.2012.6237859
Filename
6237859
Link To Document