Title :
Near-field scan - State of the art and standardisation
Author :
Shepherd, John ; Marot, Christian ; Vrignon, Bertrand ; Ben Dhia, S.
Author_Institution :
Freescale Semicond., Toulouse, France
Abstract :
Near-field scan techniques have considerably evolved over recent years and will no doubt continue to do so in the future. Standardisation of these measurement techniques ensures stable reproducibility and provides guideline for those who are new to the field. The state of the art is summarised and the evolution of applicable standards is described.
Keywords :
electromagnetic compatibility; measurement standards; measurement standardisation; near-field scan technique; stable reproducibility; Atmospheric measurements; Dielectric measurements; Immune system; Immunity testing; Magnetic field measurement; Particle measurements; Probes;
Conference_Titel :
Electromagnetic Compatibility (APEMC), 2012 Asia-Pacific Symposium on
Conference_Location :
Singapore
Print_ISBN :
978-1-4577-1557-0
Electronic_ISBN :
978-1-4577-1558-7
DOI :
10.1109/APEMC.2012.6237881
