DocumentCode
2594006
Title
Near-field scan - State of the art and standardisation
Author
Shepherd, John ; Marot, Christian ; Vrignon, Bertrand ; Ben Dhia, S.
Author_Institution
Freescale Semicond., Toulouse, France
fYear
2012
fDate
21-24 May 2012
Firstpage
1
Lastpage
4
Abstract
Near-field scan techniques have considerably evolved over recent years and will no doubt continue to do so in the future. Standardisation of these measurement techniques ensures stable reproducibility and provides guideline for those who are new to the field. The state of the art is summarised and the evolution of applicable standards is described.
Keywords
electromagnetic compatibility; measurement standards; measurement standardisation; near-field scan technique; stable reproducibility; Atmospheric measurements; Dielectric measurements; Immune system; Immunity testing; Magnetic field measurement; Particle measurements; Probes;
fLanguage
English
Publisher
ieee
Conference_Titel
Electromagnetic Compatibility (APEMC), 2012 Asia-Pacific Symposium on
Conference_Location
Singapore
Print_ISBN
978-1-4577-1557-0
Electronic_ISBN
978-1-4577-1558-7
Type
conf
DOI
10.1109/APEMC.2012.6237881
Filename
6237881
Link To Document