• DocumentCode
    2594269
  • Title

    Self-Calibrating Equalizer for Optimal Jitter Performance Using On-chip Eye Monitoring

  • Author

    Chandrasekaran, Srinivasaraman ; Desai, Kunal ; Sendhil, Arul ; Ng, William

  • fYear
    2011
  • fDate
    2-7 Jan. 2011
  • Firstpage
    6
  • Lastpage
    11
  • Abstract
    Magnitude of equalization applied by a receiver equalization circuit varies across silicon process and environmental conditions. We propose a novel method to auto calibrate a programmable receiver equalization circuit to a target gain equalization value without the use of any external test equipment or channel. This method is built upon on-chip eye monitoring and internal loop back capabilities, which are used to measure the gain equalization value. By executing this on-chip gain equalization measurement for various equalizer settings, the setting which produces equalization that is closest to the target value can be determined. This has been implemented in 45nm CMOS for a PCI Express 2.0 transceiver hardware running at 5Gbps. Lab results with test silicon demonstrate the on-chip eye height measurement capabilities.
  • Keywords
    CMOS integrated circuits; calibration; equalisers; height measurement; intersymbol interference; jitter; programmable circuits; transceivers; CMOS technology; PCI Express 2.0 transceiver; external test equipment; eye height measurement; gain equalization value; internal loop back; intersymbol interference; on-chip eye monitoring; optimal jitter performance; programmable receiver equalization circuit; self-calibrating equalizer; size 45 nm; Calibration; Equalizers; Gain measurement; Jitter; Receivers; System-on-a-chip; Temperature measurement; Equalization Calibration; ISI reduction; eye height measurement; gain equalization; in-situ eye; ratio of eye heights;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Design (VLSI Design), 2011 24th International Conference on
  • Conference_Location
    Chennai
  • ISSN
    1063-9667
  • Print_ISBN
    978-1-61284-327-8
  • Electronic_ISBN
    1063-9667
  • Type

    conf

  • DOI
    10.1109/VLSID.2011.38
  • Filename
    5718769