• DocumentCode
    2594368
  • Title

    Immunity modelling of electronics board

  • Author

    Alilou, Oussama ; Fontaine, Vincent ; Marot, Christian

  • Author_Institution
    Serma-Ing., Cornebarrieu, France
  • fYear
    2012
  • fDate
    21-24 May 2012
  • Firstpage
    89
  • Lastpage
    92
  • Abstract
    Electronic boards will become higher density of integration with lower supply voltages. Internal integrated Circuits have more and more gates on silicon and Printed circuits Boards use many high density technologies. That size reduction integration with nearby signals positions promotes internal crosstalk, sizes reduction of die geometries increases unwanted current in parasitic structure as isolation capacitances. Consequently, the immunity of electronic boards is becoming more and more critical and the use of models and simulation tools is hardly required to optimize during the design phases the susceptibility behaviour and also to predict the immunity strength to conducted disturbances both at the IC and the application level. This paper introduces in section I an overview of the IEC projects for Integrated Circuit modelling. An immunity model for an electronic board is described in section II. Example model of driver bus is presented in a part III. Simulation results of a immunity test with that driver immunity model is presented in a part IV.
  • Keywords
    IEC standards; integrated circuit modelling; printed circuit design; silicon; IC modelling; IEC projects; driver bus model; electronic board immunity modelling; immunity strength prediction; integrated circuit modelling; internal crosstalk; internal integrated circuits; parasitic structure; printed circuits boards; silicon; size reduction integration; Analytical models; Atmospheric modeling; Capacitance; Electromagnetic compatibility; Integrated circuit modeling; Predictive models;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electromagnetic Compatibility (APEMC), 2012 Asia-Pacific Symposium on
  • Conference_Location
    Singapore
  • Print_ISBN
    978-1-4577-1557-0
  • Electronic_ISBN
    978-1-4577-1558-7
  • Type

    conf

  • DOI
    10.1109/APEMC.2012.6237903
  • Filename
    6237903