• DocumentCode
    2594949
  • Title

    Quantification of Particulate Mixing in Nanocomposites

  • Author

    Hui, L. ; Smith, R.C. ; Wang, X. ; Nelson, J.K. ; Schadler, L.S.

  • Author_Institution
    Rensselaer Polytech. Inst., Troy, NY
  • fYear
    2008
  • fDate
    26-29 Oct. 2008
  • Firstpage
    317
  • Lastpage
    320
  • Abstract
    Quality control has demanded methods to quantify the mixing state of nanoparticles imbedded in polymeric materials. Several quantification methods are reviewed based on the analysis of images from electron microscopy. This includes the quadrat-based skewness, nearest neighbor distance, the k-function and Monte Carlo method. A novel method in which the dispersion and distribution are evaluated respectively through aspects of the equivalent radius deviation and the distance between the gravity centers of particles or clusters is proposed. The efficacy of the method suggested is illustrated by the analysis of transmission electron microscopy (TEM) images of untreated and vinyl-silane treated 12.5 wt% nano-silica/XLPE. It is shown that the combined method provides complete information on the state of the composite, and is the most direct and convenient methodology.
  • Keywords
    Monte Carlo methods; mixing; nanocomposites; nanoparticles; silicon compounds; transmission electron microscopy; Monte Carlo method; SiO2; nano-silica/XLPE; nanocomposites; nanoparticles; particulate mixing; polymeric materials; quality control; transmission electron microscopy; vinyl-silane; Aggregates; Environmental factors; Image analysis; Nanocomposites; Nanoparticles; Particle measurements; Plastic insulation; Polymers; Scanning electron microscopy; Transmission electron microscopy;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Insulation and Dielectric Phenomena, 2008. CEIDP 2008. Annual Report Conference on
  • Conference_Location
    Quebec, QC
  • Print_ISBN
    978-1-4244-2548-8
  • Electronic_ISBN
    978-1-4244-2549-5
  • Type

    conf

  • DOI
    10.1109/CEIDP.2008.4772831
  • Filename
    4772831