Title :
Microstructural Analysis Of CoPtCr And CoPtCrB Thin Film Magnetic Layers On Cr-Alloy Underlayers
Author :
McKinIay, S. ; Doemer, M. ; Qian, C. ; Mirzamaani, M. ; Sinclair, R.
Author_Institution :
Stanford University
Keywords :
Chromium; Coercive force; Grain size; Lattices; Magnetic analysis; Magnetic films; Magnetic separation; Perpendicular magnetic recording; Stacking; X-ray imaging;
Conference_Titel :
Magnetics Conference, 1997. Digests of INTERMAG '97., 1997 IEEE International
Conference_Location :
New Orleans, LA, USA
Print_ISBN :
0-7803-3862-6
DOI :
10.1109/INTMAG.1997.597336