Title :
Using confidence factor to improve reliability of wide frequency range impedance measurement. Application to H.F. transformer characterization
Author :
Besri, A. ; Chazal, Herve ; Keradec, J.-P. ; Margueron, Xavier
Author_Institution :
Lab. de Genie Electr. de Grenoble (G2Elab), UJF, St. Martin d´Heres, France
Abstract :
Impedance analyzers are efficient in acquiring wide range impedance measurements in a wide frequency range. However, when measuring low impedances, short circuits used for compensation process can´t be considered as ideal and analogue problem appears for open circuit compensation. Fortunately, because impedance matrix of a two-port passive circuit is symmetrical, characterizing this circuit by four independent impedance measurements introduces redundancy. That property supplies a useful consistency test we call “confidence factor”. Looking at this factor, several causes of measurement inaccuracy can be detected. Alternatively, extra equation supplied by redundancy can also be used to add one unknown impedance to the three computed. This way, impact of the impedance of a real imperfect short-circuit can be removed. In this paper, we first present the interest of the confidence factor and then we show how to lower errors related to imperfect short-circuit. Finally, we show how to use these advances to better characterize HF power transformers and to measure weak wiring inductances.
Keywords :
electric impedance measurement; high-frequency transformers; impedance matrix; inductance measurement; passive networks; power transformers; two-port networks; HF power transformer characterization; compensation process; impedance analyzer; impedance matrix; impedance measurement; short circuits; two-port passive circuit; wiring inductance measurement; Circuit testing; Equations; Frequency; Hafnium; Impedance measurement; Passive circuits; Power measurement; Power transformers; Redundancy; Symmetric matrices; H.F. power transformers; component; confidence factor; impedance measurements;
Conference_Titel :
Instrumentation and Measurement Technology Conference, 2009. I2MTC '09. IEEE
Conference_Location :
Singapore
Print_ISBN :
978-1-4244-3352-0
DOI :
10.1109/IMTC.2009.5168424