DocumentCode :
2595230
Title :
Relation between Concentration of Partial Discharge and Surface Degradation and Breakdown
Author :
Suzuoki, Y. ; Kodani, Y. ; Komori, F. ; Kato, T.
Author_Institution :
Nagoya Univ., Nagoya
fYear :
2008
fDate :
26-29 Oct. 2008
Firstpage :
404
Lastpage :
407
Abstract :
Partial discharge (PD) in a void reflects degradation of insulating material and, therefore, is utilized for insulation diagnosis. Although it is well known that PD pattern changes with voltage application, it is not clear how the pattern change is related to material degradation or how it is related to final breakdown. We simultaneously observed PD characteristics and light emission from partial discharge and the results were compared with those of surface observation. Both in an open void where atmospheric condition does not change and in a closed void, PD activity become concentrated in a small spot after certain time of voltage application. This seems to be caused by field concentration due to deposit of degradation products. In an open void, the intensity of each PD pulse is strong but the time to final breakdown is long. This is explained by the fact that the PD spot does not remain in the same place but constantly moves around, leading to smaller local energy input. On the other hand in a closed void, though the intensity of each PD pulse is small, the time before final breakdown is relatively short. This is explained by the experimental result that the PD spot in this case remains in the same place and the local energy input seems large. Finally, by terminating voltage application just before the final breakdown it is confirmed that the breakdown starts at the spot of PD concentration where the deposit exists.
Keywords :
insulating materials; partial discharges; surface discharges; PD concentration; breakdown; insulating material; insulation diagnosis; partial discharge; surface degradation; Breakdown voltage; Degradation; Dielectrics and electrical insulation; Electric breakdown; Electrodes; Insulation testing; Optical microscopy; Optical pulses; Partial discharges; Surface discharges;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical Insulation and Dielectric Phenomena, 2008. CEIDP 2008. Annual Report Conference on
Conference_Location :
Quebec, QC
Print_ISBN :
978-1-4244-2548-8
Electronic_ISBN :
978-1-4244-2549-5
Type :
conf
DOI :
10.1109/CEIDP.2008.4772847
Filename :
4772847
Link To Document :
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