DocumentCode
2595515
Title
A test-bed designed to utilize Zhu´s general sampling theorem to characterize power amplifiers
Author
Andersen, Olav ; Bjorsell, Niclas ; Keskitalo, Niclas
Author_Institution
Ericsson AB, Gavle, Sweden
fYear
2009
fDate
5-7 May 2009
Firstpage
201
Lastpage
204
Abstract
Characterizing power amplifiers require test set-ups with performance superior to the power amplifiers. A commonly used method is to use an IQ-demodulator. However, problem arises due to imperfections in the demodulator such as IQ-imbalance; an alternative method is to use a direct down converter to intermediate frequency. The drawback then is the limited bandwidth. However, the required bandwidth of the ADC does not need to be exceptional. According to Zhu´s general sampling theorem is it enough to sample the output signal at the Nyquist rate of the input. However, even though the required sampling rate is reduced the demands on the analog bandwidth remains. Unfortunately, commercially available instruments such as vector signal analyzers can not be used for this purpose since their analog bandwidth is too small. In this paper a test-bed is designed to utilize the Zhu´s general sampling theorem. The RF front-end has frequency range of 500 MHz - 2.7 GHz and a bandwidth of 1 GHz. All performance data are verified with measurements.
Keywords
Nyquist criterion; UHF amplifiers; analogue-digital conversion; power amplifiers; signal sampling; ADC bandwidth; IQ-demodulator; IQ-imbalance; Nyquist rate input; RF front-end frequency range; Zhu general sampling theorem; analog bandwidth sampling rate; direct down converter; frequency 500 MHz to 2.7 GHz; power amplifier; test-bed design; vector signal analyzer; Bandwidth; Nonlinear systems; Passive filters; Power amplifiers; Power measurement; Radio frequency; Radiofrequency amplifiers; Sampling methods; Switches; Testing; Measurement system; Power amplifier; Zhu´s general sampling theorem; component;
fLanguage
English
Publisher
ieee
Conference_Titel
Instrumentation and Measurement Technology Conference, 2009. I2MTC '09. IEEE
Conference_Location
Singapore
ISSN
1091-5281
Print_ISBN
978-1-4244-3352-0
Type
conf
DOI
10.1109/IMTC.2009.5168443
Filename
5168443
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