• DocumentCode
    2595522
  • Title

    The Effect of Voltage Waveform on Phase-Resolved Electroluminescence Measurements

  • Author

    Ariffin, A. Mohd ; Lewin, P.L. ; Mills, D.H. ; Dodd, S.J.

  • Author_Institution
    Tony Davies High Voltage Lab., Univ. of Southampton, Southampton, UK
  • fYear
    2008
  • fDate
    26-29 Oct. 2008
  • Firstpage
    603
  • Lastpage
    606
  • Abstract
    Space charge plays a significant role in long term electrical degradation of polymeric insulation in high voltage cables and consequently there is growing interest in the measurement of the energy dissipation of mobile and trapped charges in dielectric molecules. The dissipation process is associated with the emission of visible photons, a process known as electroluminescence (EL) and can be used, potentially, as an indicator for the initiation of electrical ageing of insulation. This paper presents the experimental work undertaken to examine EL from different ac applied voltages. Using a charge coupled device (CCD) detection system, the setup allows the determination of the light emission occurrence respect to the applied field. Phase-resolved EL measurements have been obtained using sinusoidal, triangular and square voltages.
  • Keywords
    electric breakdown; electroluminescence; polymer insulators; power cable insulation; space charge; charge coupled device detection system; dielectric molecules; electrical degradation; phase-resolved electroluminescence measurements; polymeric insulation; space charge; voltage waveform; Cable insulation; Dielectric measurements; Dielectrics and electrical insulation; Electroluminescence; Phase measurement; Plastic insulation; Polymers; Space charge; Thermal degradation; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Insulation and Dielectric Phenomena, 2008. CEIDP 2008. Annual Report Conference on
  • Conference_Location
    Quebec, QC
  • Print_ISBN
    978-1-4244-2548-8
  • Electronic_ISBN
    978-1-4244-2549-5
  • Type

    conf

  • DOI
    10.1109/CEIDP.2008.4772866
  • Filename
    4772866