Title :
Deembedding of filters´ responses from diplexer measurements
Author :
Oldoni, Matteo ; Seyfert, F. ; Macchiarella, Giuseppe ; Pacaud, Damien
Author_Institution :
Politecnico di Milano, Milan, Italy
Abstract :
Summary form only given, as follows. In this paper we present a method to compute the characteristic polynomials of two filters embedded in a diplexer for which a set of measured scattering parameters is given. This method works without particular assumptions on the junction or the lossless nature of the filters and is based on a rational fitting derived from the analytical expression of the diplexer response. This procedure is typically meant as a deembeding step to yield the coupling matrices of the filters to be tuned.
Conference_Titel :
Microwave Symposium Digest (MTT), 2011 IEEE MTT-S International
Conference_Location :
Baltimore, MD
Print_ISBN :
978-1-61284-754-2
Electronic_ISBN :
0149-645X
DOI :
10.1109/MWSYM.2011.5973385