Title :
Electromagnetic susceptibility analysis of ICs using DPI method with consideration of PDN
Author :
Pu, Bo ; Lee, Jae Joong ; Kwak, Sang Keun ; Kim, So Young ; Nah, Wansoo
Author_Institution :
Dept. of Electr. Eng., Sungkyunkwan Univ., Suwon, South Korea
Abstract :
This paper predicts electromagnetic susceptibility (EMS) of integrated circuits (ICs) with novel consideration of complex power distribution network (PDN). For accurate simulation performance, the set-up model is derived in detail, especially the PDN. PDN model is extracted from the physical configuration and also in view of the function of system to express the ground bounce exactly since it is a pivot factor in DPI test for EMS. After measurement, comparison with simulation result is applied to validate the proposed model and estimate the electromagnetic susceptibility of ICs.
Keywords :
electromagnetic compatibility; integrated circuit modelling; magnetic susceptibility; DPI method; DPI test; EMC; EMS; IC; PDN consideration; PDN model; electromagnetic compatibility; electromagnetic susceptibility analysis; integrated circuit; power distribution network model; set-up model; Couplers; Electromagnetics; Energy management; Integrated circuit modeling; Power systems; Semiconductor device measurement;
Conference_Titel :
Electromagnetic Compatibility (APEMC), 2012 Asia-Pacific Symposium on
Conference_Location :
Singapore
Print_ISBN :
978-1-4577-1557-0
Electronic_ISBN :
978-1-4577-1558-7
DOI :
10.1109/APEMC.2012.6237980
