Title :
The evaluation flow for EMC behavior of RF ICs
Author :
Yin-Cheng Chang ; Wang, Bing-Yi ; Hsu, Shawn S H ; Chang, Yen-Tang ; Chiu-Kuo Chen ; Ying-Zong Juang ; Hsu-Chen Cheng ; Da-Chiang Chang
Author_Institution :
Chip Implementation Center, Nat. Appl. Res. Labs., Hsinchu, Taiwan
Abstract :
The evaluation flow for estimating the EMC behavior of RF ICs is proposed. Conducting the electronic design automation (EDA) tools, the evaluation flow naturally embeds in the conventional RF IC design flow and extracts the resistor, inductor, and capacitor components of the network efficiently. The results of the evaluation flow help the IC designer to generate the integrated circuit emission model (ICEM) composed of internal activity (IA) and power distribution network (PDN). It is useful for the co-design of IC, package, and board regarding the system-level EMC behavior in the very early design phase. The measured impedance of the PDN shows that the proposed flow is able to improve the accuracy of the predicted impedance. Additionally, the measured results of a board carrying an RF IC and being compliant with IEC-61967 show the proposed evaluation flow captures the salient properties of the spectrum emitted by the RF IC.
Keywords :
IEC standards; electromagnetic compatibility; electronic design automation; integrated circuit design; integrated circuit interconnections; integrated circuit modelling; radiofrequency integrated circuits; EDA tool; IC-package-board codesign; ICEM; IEC-61967; PDN; RF IC design flow; capacitor component; design phase; electronic design automation tool; evaluation flow; inductor component; integrated circuit emission model; internal activity; power distribution network; resistor component; spectrum salient properties; system-level EMC behavior; Integrated circuit modeling; Noise; Noise measurement; Radio frequency; Resistors; Semiconductor device measurement; Semiconductor device modeling;
Conference_Titel :
Electromagnetic Compatibility (APEMC), 2012 Asia-Pacific Symposium on
Conference_Location :
Singapore
Print_ISBN :
978-1-4577-1557-0
Electronic_ISBN :
978-1-4577-1558-7
DOI :
10.1109/APEMC.2012.6237997