Title :
EMC standards at IC level - status of IEC and technical goals of the SEISME project
Author :
Marot, Christian ; Sicard, Etienne
Author_Institution :
EADS-IW, Toulouse, France
Abstract :
This paper reviews the methods proposed by the International Electrotechnical Commission (IEC) for characterizing and modelling of Electromagnetic Compatibility (EMC) of Integrated Circuits (IC). The development of tools and EMC performance prediction methods is also described in the context of IC obsolescence, through the French research project SEISME.
Keywords :
IEC standards; electromagnetic compatibility; integrated circuits; EMC standards; IC level; IC obsolescence context; IEC status; International Electrotechnical Commission; SEISME project; electromagnetic compatibility; integrated circuit level; IEC standards; Immunity testing; Integrated circuit modeling; Proposals;
Conference_Titel :
Electromagnetic Compatibility (APEMC), 2012 Asia-Pacific Symposium on
Conference_Location :
Singapore
Print_ISBN :
978-1-4577-1557-0
Electronic_ISBN :
978-1-4577-1558-7
DOI :
10.1109/APEMC.2012.6237998
