Title :
FBG-based dynamic strain sensors demodulated by self-mixing interferometry: Improving strain measurement resolution
Author :
Suleiman, Muhammad ; Seat, H.C. ; Bosch, Thierry
Author_Institution :
Lab. d´Optoelectron. pour les Syst. Embarques, Univesite de Toulouse, Toulouse, France
Abstract :
A fiber optic strain sensor has been devised based on the use of optical feedback or self-mixing interference within the cavity of a single-longitudinal-mode laser as a novel fiber Bragg grating interrogation scheme for strain measurement in the domain of structural health monitoring. The entire sensor device thus simply consists of a laser diode with an integrated photodiode coupled to a fiber Bragg grating under strain. The feasibility of demodulating the induced small wavelength shifts of fiber Bragg gratings under dynamic mechanical loading by self-mixing interferometry has been experimentally verified with strain gauges. This current investigation further reports new work to improve the accuracy of the measured strains. Measurement resolution, defined by the distance between two consecutive peaks from the optical fringes, has been improved from 10 με to 6 με by increasing the fiber gauge length.
Keywords :
Bragg gratings; condition monitoring; demodulation; fibre optic sensors; laser feedback; laser modes; light interferometry; measurement by laser beam; strain measurement; strain sensors; structural engineering; FBG-based dynamic strain sensor demodulation; fiber Bragg grating interrogation scheme; integrated photodiode; optical feedback; optical fringes; self-mixing interferometry; single-longitudinal-mode laser; strain measurement resolution; structural health monitoring; Bragg gratings; Capacitive sensors; Fiber gratings; Interference; Optical feedback; Optical fiber sensors; Optical fibers; Optical interferometry; Strain measurement; Wavelength measurement; FBG; component; gauge length; resolution; self-mixing; strain;
Conference_Titel :
Instrumentation and Measurement Technology Conference, 2009. I2MTC '09. IEEE
Conference_Location :
Singapore
Print_ISBN :
978-1-4244-3352-0
DOI :
10.1109/IMTC.2009.5168470