Title :
A new current sensor based on the Miller effect highly immune to EMI
Author :
Aiello, Orazio ; Fiori, Franco
Author_Institution :
Eln. Dept., Politec. di Torino, Torino, Italy
Abstract :
This paper deals with the susceptibility to electromagnetic interference (EMI) of circuits used in smart power integrated circuits to sense the current of power transistors. The susceptibility of a conventional current sensor based on the mirroring principle is first investigated. Then a new circuit that avoids the electrical connection of the current sensor to the power transistor drain terminal is proposed. The susceptibility of the above mentioned current sensors is discussed and evaluated by means of time-domain computer simulations.
Keywords :
electric sensing devices; electromagnetic devices; electromagnetic interference; power integrated circuits; power transistors; EMI; Miller effect; current sensor; electrical connection avoidance; electromagnetic interference; mirroring principle; power transistor drain terminal; smart power integrated circuits; time-domain computer simulations; MOSFET circuits; Magnetic susceptibility; Switches; Time frequency analysis; Transistors; Wireless communication; Wireless sensor networks;
Conference_Titel :
Electromagnetic Compatibility (APEMC), 2012 Asia-Pacific Symposium on
Conference_Location :
Singapore
Print_ISBN :
978-1-4577-1557-0
Electronic_ISBN :
978-1-4577-1558-7
DOI :
10.1109/APEMC.2012.6238001
