DocumentCode :
2596331
Title :
Metrological characterization of algorithms adopted for voltage dip measurement
Author :
Gallo, Daniele ; Landi, Carmine ; Luiso, Mario
Author_Institution :
Dipt. di Ing. dell´Inf., Seconda Univ. di Napoli, Aversa, Italy
fYear :
2009
fDate :
5-7 May 2009
Firstpage :
420
Lastpage :
425
Abstract :
This paper analyzes accuracy of algorithms commonly adopted in instrument devoted to the detection and the characterization of voltage dips (also called sags). This analysis is particularly interesting because the results of dip measurements are utilized for calculation of severity levels and the site index assessment that are parameters adopted in determination of quality level of power supply but also in developing planning and design criteria of new electrical power grid or for selecting equipment with proper intrinsic immunity. Anyway there is a certain degree of freedom is left to instrument manufacturers (f.i. the choice of dip detection algorithm) and it can be found that, different instruments significantly disagree in some actual measurements. The paper analyzes most diffused dip detection algorithms presenting the introduced systematic deviations in event characterization. The obtained results are aimed to be taken into account and applied to performance verification of a commercial dip monitoring instrument.
Keywords :
power grids; power supply quality; power system measurement; voltage measurement; commercial dip monitoring instrument; electrical power grid planning; instrument manufacturers; metrological characterization; power supply quality; voltage dip measurement; Algorithm design and analysis; Detection algorithms; Electric variables measurement; Instruments; Particle measurements; Power grids; Power measurement; Power supplies; Voltage fluctuations; Voltage measurement; Accuracy; Event Duration; Measurement; Power Quality; Sag; Voltage Dip;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Instrumentation and Measurement Technology Conference, 2009. I2MTC '09. IEEE
Conference_Location :
Singapore
ISSN :
1091-5281
Print_ISBN :
978-1-4244-3352-0
Type :
conf
DOI :
10.1109/IMTC.2009.5168485
Filename :
5168485
Link To Document :
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