DocumentCode :
2596422
Title :
Black-box modelling of conducted electromagnetic emissions by adjustable complexity support vector regression machines
Author :
Ceperic, Vladimir ; Gielen, Georges ; Baric, Adrijan
Author_Institution :
FER, Univ. of Zagreb, Zagreb, Croatia
fYear :
2012
fDate :
21-24 May 2012
Firstpage :
17
Lastpage :
20
Abstract :
A black-box method for modelling of conducted electromagnetic emissions (EME) at an integrated circuit (IC) power supply pin and ground level by adjustable complexity support vector regression machines (ACSVR) is presented. The ACSVR provides a basis for representing the nonlinear dynamic conducted EME. The ACSVR enables accurate modelling of conducted EME according to the IEC 61967-4 1Ω method and allows the adjustment of accuracy versus model simulation speed. As a test case, the EME model of conducted emissions of a 242-transistor voltage reference with offset compensation is presented. The resulting models (implemented in Verilog A) are accurate and fast to execute.
Keywords :
IEC standards; electromagnetic compatibility; electronic engineering computing; integrated circuit modelling; nonlinear dynamical systems; regression analysis; support vector machines; ACSVR; IC power supply pin; IEC 61967-4 1Ω method; Verilog A; adjustable-complexity support vector regression machines; black-box modelling; conducted electromagnetic emission; integrated circuit power supply pin; model simulation speed; nonlinear dynamic conducted EME model; offset compensation; transistor voltage reference; Complexity theory; Data models; Integrated circuit modeling; Optimization; Predictive models; Support vector machines;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electromagnetic Compatibility (APEMC), 2012 Asia-Pacific Symposium on
Conference_Location :
Singapore
Print_ISBN :
978-1-4577-1557-0
Electronic_ISBN :
978-1-4577-1558-7
Type :
conf
DOI :
10.1109/APEMC.2012.6238017
Filename :
6238017
Link To Document :
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