• DocumentCode
    2596473
  • Title

    Direct simulation of material permittivities by using an eigen-susceptibility formulation of the vector variational approach

  • Author

    Gaebler, Alexander ; Goelden, Felix ; Mueller, Steffen ; Penirschke, Andreas ; Jakoby, Rolf

  • Author_Institution
    Wireless Commun. Lab., Tech. Univ. Darmstadt, Darmstadt, Germany
  • fYear
    2009
  • fDate
    5-7 May 2009
  • Firstpage
    463
  • Lastpage
    467
  • Abstract
    This paper presents a new method for the extraction of material parameters, in this case the permittivity, by formulating the Maxwell equations as an eigen-susceptibility problem of the considered sample. This offers a direct solution of the desired material parameters by utilizing adequate and well proven numerical techniques. Hence, it is very useful if analytical approaches do not provide the aimed accuracy or even fail completely. The procedure will be demonstrated by applying the variational approach to a triple mode cavity perturbation method for the characterization of the complex permittivity tensor of general biaxial anisotropic media.
  • Keywords
    Maxwell equations; anisotropic media; eigenvalues and eigenfunctions; microwave measurement; permittivity measurement; perturbation techniques; variational techniques; vectors; CST Microwave Studio eigenmode-simulation; Maxwell equations; complex permittivity tensor characterization; direct simulation; eigen-susceptibility formulation; general biaxial anisotropic media; material permittivity extraction; numerical technique; triple mode cavity perturbation method; vector variational approach; Anisotropic magnetoresistance; Cavity perturbation methods; Computational modeling; Dielectric materials; Failure analysis; Maxwell equations; Permittivity; Resonance; Resonant frequency; Tensile stress;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Instrumentation and Measurement Technology Conference, 2009. I2MTC '09. IEEE
  • Conference_Location
    Singapore
  • ISSN
    1091-5281
  • Print_ISBN
    978-1-4244-3352-0
  • Type

    conf

  • DOI
    10.1109/IMTC.2009.5168493
  • Filename
    5168493