DocumentCode :
2596520
Title :
Determination of the effective atomic numbers of light composite materials
Author :
Athanassiadis, K.N.
Author_Institution :
Dept. of Autom., Alexander Technol. & Educ. Inst., Thessaloniki, Greece
fYear :
2009
fDate :
5-7 May 2009
Firstpage :
477
Lastpage :
481
Abstract :
The analysis of physical and chemical characteristics of materials (composite or not) via the determination of change in the effective atomic number (Zeff) can be performed by measuring the relation between the intensities of γ-rays under coherent (Rayleigh) and inelastic (Compton) scattering. The creation of methods for no-contact, non destructive control of Zeff and density ρ of localized areas of the material samples will allow the clarification of the physical and mathematical models of degradation of the composite materials under conditions of high temperatures. For the determination of Zeff, it is necessary to use detectors with high energy resolution, due to the need to distinguish between spectrum lines of coherent and incoherent scattering of γ-rays. Using a solid state Ge(Li) detector, we developed a method for the determination of the effective atomic number, Zeff. This number was determined experimentally for several materials, including Textolite, which has been exposed to high temperature.
Keywords :
Rayleigh scattering; composite materials; gamma-ray applications; radioactivity measurement; change determination; coherent scattering; composite materials degradation; effective atomic numbers determination; incoherent scattering; inelastic scattering; light composite materials; nondestructive control; solid state detector; spectrum lines; textolite; Atomic measurements; Chemical analysis; Composite materials; Degradation; Light scattering; Mathematical model; Performance analysis; Performance evaluation; Rayleigh scattering; Temperature control; γ-detector; Compton scattering; Rayleigh scattering; effective atomic number; measurement uncertainties;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Instrumentation and Measurement Technology Conference, 2009. I2MTC '09. IEEE
Conference_Location :
Singapore
ISSN :
1091-5281
Print_ISBN :
978-1-4244-3352-0
Type :
conf
DOI :
10.1109/IMTC.2009.5168496
Filename :
5168496
Link To Document :
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