DocumentCode
2596520
Title
Determination of the effective atomic numbers of light composite materials
Author
Athanassiadis, K.N.
Author_Institution
Dept. of Autom., Alexander Technol. & Educ. Inst., Thessaloniki, Greece
fYear
2009
fDate
5-7 May 2009
Firstpage
477
Lastpage
481
Abstract
The analysis of physical and chemical characteristics of materials (composite or not) via the determination of change in the effective atomic number (Zeff) can be performed by measuring the relation between the intensities of γ-rays under coherent (Rayleigh) and inelastic (Compton) scattering. The creation of methods for no-contact, non destructive control of Zeff and density ρ of localized areas of the material samples will allow the clarification of the physical and mathematical models of degradation of the composite materials under conditions of high temperatures. For the determination of Zeff, it is necessary to use detectors with high energy resolution, due to the need to distinguish between spectrum lines of coherent and incoherent scattering of γ-rays. Using a solid state Ge(Li) detector, we developed a method for the determination of the effective atomic number, Zeff. This number was determined experimentally for several materials, including Textolite, which has been exposed to high temperature.
Keywords
Rayleigh scattering; composite materials; gamma-ray applications; radioactivity measurement; change determination; coherent scattering; composite materials degradation; effective atomic numbers determination; incoherent scattering; inelastic scattering; light composite materials; nondestructive control; solid state detector; spectrum lines; textolite; Atomic measurements; Chemical analysis; Composite materials; Degradation; Light scattering; Mathematical model; Performance analysis; Performance evaluation; Rayleigh scattering; Temperature control; γ-detector; Compton scattering; Rayleigh scattering; effective atomic number; measurement uncertainties;
fLanguage
English
Publisher
ieee
Conference_Titel
Instrumentation and Measurement Technology Conference, 2009. I2MTC '09. IEEE
Conference_Location
Singapore
ISSN
1091-5281
Print_ISBN
978-1-4244-3352-0
Type
conf
DOI
10.1109/IMTC.2009.5168496
Filename
5168496
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