• DocumentCode
    2596520
  • Title

    Determination of the effective atomic numbers of light composite materials

  • Author

    Athanassiadis, K.N.

  • Author_Institution
    Dept. of Autom., Alexander Technol. & Educ. Inst., Thessaloniki, Greece
  • fYear
    2009
  • fDate
    5-7 May 2009
  • Firstpage
    477
  • Lastpage
    481
  • Abstract
    The analysis of physical and chemical characteristics of materials (composite or not) via the determination of change in the effective atomic number (Zeff) can be performed by measuring the relation between the intensities of γ-rays under coherent (Rayleigh) and inelastic (Compton) scattering. The creation of methods for no-contact, non destructive control of Zeff and density ρ of localized areas of the material samples will allow the clarification of the physical and mathematical models of degradation of the composite materials under conditions of high temperatures. For the determination of Zeff, it is necessary to use detectors with high energy resolution, due to the need to distinguish between spectrum lines of coherent and incoherent scattering of γ-rays. Using a solid state Ge(Li) detector, we developed a method for the determination of the effective atomic number, Zeff. This number was determined experimentally for several materials, including Textolite, which has been exposed to high temperature.
  • Keywords
    Rayleigh scattering; composite materials; gamma-ray applications; radioactivity measurement; change determination; coherent scattering; composite materials degradation; effective atomic numbers determination; incoherent scattering; inelastic scattering; light composite materials; nondestructive control; solid state detector; spectrum lines; textolite; Atomic measurements; Chemical analysis; Composite materials; Degradation; Light scattering; Mathematical model; Performance analysis; Performance evaluation; Rayleigh scattering; Temperature control; γ-detector; Compton scattering; Rayleigh scattering; effective atomic number; measurement uncertainties;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Instrumentation and Measurement Technology Conference, 2009. I2MTC '09. IEEE
  • Conference_Location
    Singapore
  • ISSN
    1091-5281
  • Print_ISBN
    978-1-4244-3352-0
  • Type

    conf

  • DOI
    10.1109/IMTC.2009.5168496
  • Filename
    5168496