Open series fault comparison in AC & DC micro-grid architectures

Author

Estes, H.B. ; Kwasinski, A. ; Hebner, R.E. ; Uriarte, F.M. ; Gattozzi, A.L.

Author_Institution

Dept. of Electr. & Comput. Eng., Univ. of Texas at Austin, Austin, TX, USA

fYear

2011

fDate

9-13 Oct. 2011

Firstpage

1

Lastpage

6

Abstract

This paper explores empirical observations of open series fault (arc fault) testing during current interruptions. Emphasis is on dc systems, but arc behavior is also compared to that of ac systems under "quasi-equivalent" circuit parameters. Specific parameters that are considered regarding arc behavior include gap voltage, current, dissipated power, voltage and current transient characteristics, reignition, bus disturbances, and contact position during dc arc collapse. Based on these results, comparisons between ac and dc systems seem to indicate that different arc-related challenges exist for both dc and ac architectures.

Keywords

arcs (electric); distributed power generation; fault diagnosis; power distribution faults; power generation faults; AC microgrid architecture; DC microgrid architecture; arc fault testing; bus disturbance; contact position; current interruption; current transient; dissipated power; gap voltage; open series fault comparison; reignition; Impedance; arc transient; current interruption; direct current; micro-grid; open series fault; spike;

fLanguage

English

Publisher

ieee

Conference_Titel

Telecommunications Energy Conference (INTELEC), 2011 IEEE 33rd International

Conference_Location

Amsterdam

ISSN

2158-5210

Print_ISBN

978-1-4577-1249-4

Electronic_ISBN

2158-5210

Type

conf

DOI

10.1109/INTLEC.2011.6099883

Filename

6099883