Mobile tester switching subsystem architecture

The author discusses the overall system architecture of a switching subsystem that can be utilized in a mobile tester environment. It is suggested that a switching subsystem suitable for use in a downsized tester is achievable utilizing VXI. This system will make use of all of the positive attributes of VXI and will supplement them with additional features. Like a VXI system, the switching subsystem should be reconfigurable simply by loading a different complement of switching modules. This system will take advantage of common stimulus/measurement switching while at the same time recognizing that various types of performance paths (such as coaxial, solid, and power) must also be provided. To further reduce the weight, the present interface frame should be eliminated. The subsystem will utilize low insertion force (LIF) hyperbolic interface pins. It is concluded that the concept of universal-like coaxial and solid switching together with a HYPERTAC LIF interface will result in a highly versatile, easily reconfigurable switching subsystem, which will be compatible with the requirements of a downsized tester