Title :
Adaptive Grid Generation for Semiconductor Device Simulation
Author :
Coughran, W.M. ; Pinto, M.R. ; Smith, R.K.
Author_Institution :
AT&T Bell Laboratories
Keywords :
Automatic generation control; Color; Data mining; Geometry; Mesh generation; Motion pictures; Process control; Robustness; Semiconductor devices; Solid modeling;
Conference_Titel :
Numerical Modeling of Processes and Devices for Integrated Circuits, 1990. NUPAD III. 1990 Workshop on
DOI :
10.1109/NUPAD.1990.748260
