DocumentCode :
2597106
Title :
Pb-free plating: a process and solder joint reliability study
Author :
Ong, Ming Sing ; Lau, Yi Ming ; Tan, Ah Chin
Author_Institution :
Micron Semicond. Asia Pte. Ltd.
fYear :
2004
fDate :
8-10 Dec. 2004
Firstpage :
162
Lastpage :
168
Abstract :
The lead-free (Pb-free/100% tin) lead finish quality from two plating suppliers was compared to that of standard 90wt%Sn-1 0wt%Pb plating. A characterization study of the properties of the electroplated tin (Sn) showed that the finish exhibited large stable grains, high purity, comparable ionic contamination levels, and solderability. The assembled modules that employed Pb-free paste for the Sn finish showed better temperature cycling (T/C) performance, as those with Sn-Pb paste showed distinguished crack propagation. Sn whisker observation and characterization were performed on the components at time-zero, after module reflow and with the progression of T/C. The Sn whisker growth rates are explained in relation to tensile and compressive stresses on the plated layer
Keywords :
assembling; compressive strength; cracks; electroplating; lead; reflow soldering; surface treatment; tensile strength; tin; whiskers (crystal); Pb; Pb free plating; Pb-free paste; Sn; Sn whiskers; compressive stresses; crack propagation; cycling performance; electroplated tin; finish temperature; grains stability; ionic contamination levels; module reflow; plating suppliers; solder joint reliability; solder paste; solderability; tensile stresses; time-zero; Contamination; Environmentally friendly manufacturing techniques; Lead; Packaging; Scanning electron microscopy; Soldering; Strips; Temperature; Testing; Tin;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronics Packaging Technology Conference, 2004. EPTC 2004. Proceedings of 6th
Conference_Location :
Singapore
Print_ISBN :
0-7803-8821-6
Type :
conf
DOI :
10.1109/EPTC.2004.1396596
Filename :
1396596
Link To Document :
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