Title :
Hydrodynamic Simulation Of P-n Junctions In The Breakdown Regime
Author :
Quade, W. ; Rudan, M.
Author_Institution :
Universita di Blologna
Keywords :
Electric breakdown; Electrons; Equations; Hot carrier effects; Hot carriers; Hydrodynamics; Impact ionization; Independent component analysis; P-n junctions; Temperature;
Conference_Titel :
Numerical Modeling of Processes and Devices for Integrated Circuits, 1990. NUPAD III. 1990 Workshop on
DOI :
10.1109/NUPAD.1990.748269
