Title :
Determination of the reference impedance of Line - Attenuator - Reflect for on-wafer vector network analyzer calibration
Author :
Bahouche, Mebrouk ; Bergeault, Eric ; Allal, Djamel
Author_Institution :
Lab. Nat. de Metrol. et d´Essais (LNE), Trappes, France
Abstract :
A determination of the reference impedance for the three standards line-attenuator-reflect (LAR) on-wafer vector network-analyzer (VNA) calibration is proposed. As a result, it is shown that the reference impedance to which the LAR calibration is referred cannot generally be determined. Based on this consideration, a modified LAR calibration allows a precise determination of the reference impedance so that the calibration accuracy is improved. Measurement results, compared to those obtained using the conventional multiline TRL calibration, show the efficiency of the proposed method up to 45 GHz.
Keywords :
attenuators; calibration; impedance matching; network analysers; LAR; VNA calibration; line-attenuator-reflect; on-wafer vector network-analyzer; reference impedance determination; Attenuation measurement; Attenuators; Calibration; Coplanar waveguides; Impedance measurement; Instrumentation and measurement; Measurement standards; Scattering parameters; Standards development; Telecommunication standards; Calibration; component; reference impedance; scattering parameters; standards;
Conference_Titel :
Instrumentation and Measurement Technology Conference, 2009. I2MTC '09. IEEE
Conference_Location :
Singapore
Print_ISBN :
978-1-4244-3352-0
DOI :
10.1109/IMTC.2009.5168529
