Determination of the reference impedance of Line - Attenuator - Reflect for on-wafer vector network analyzer calibration

Author

Bahouche, Mebrouk ; Bergeault, Eric ; Allal, Djamel

Author_Institution

Lab. Nat. de Metrol. et d´Essais (LNE), Trappes, France

fYear

2009

fDate

5-7 May 2009

Firstpage

642

Lastpage

645

Abstract

A determination of the reference impedance for the three standards line-attenuator-reflect (LAR) on-wafer vector network-analyzer (VNA) calibration is proposed. As a result, it is shown that the reference impedance to which the LAR calibration is referred cannot generally be determined. Based on this consideration, a modified LAR calibration allows a precise determination of the reference impedance so that the calibration accuracy is improved. Measurement results, compared to those obtained using the conventional multiline TRL calibration, show the efficiency of the proposed method up to 45 GHz.

Keywords

attenuators; calibration; impedance matching; network analysers; LAR; VNA calibration; line-attenuator-reflect; on-wafer vector network-analyzer; reference impedance determination; Attenuation measurement; Attenuators; Calibration; Coplanar waveguides; Impedance measurement; Instrumentation and measurement; Measurement standards; Scattering parameters; Standards development; Telecommunication standards; Calibration; component; reference impedance; scattering parameters; standards;

fLanguage

English

Publisher

ieee

Conference_Titel

Instrumentation and Measurement Technology Conference, 2009. I2MTC '09. IEEE

Conference_Location

Singapore

ISSN

1091-5281

Print_ISBN

978-1-4244-3352-0

Type

conf

DOI

10.1109/IMTC.2009.5168529

Filename

5168529