Title :
A Supervised Process And Device Simulation For Statistical Vlsi Design
Author :
Matsuo, Hitoshi ; Masuda, Hiroo ; Yamamoto, Shuichi ; Toyabe, Toru
Author_Institution :
Hitachi, Ltd.
Keywords :
Analytical models; Circuit simulation; Coupling circuits; Laboratories; Libraries; MOSFET circuits; Numerical models; Power system modeling; Usability; Very large scale integration;
Conference_Titel :
Numerical Modeling of Processes and Devices for Integrated Circuits, 1990. NUPAD III. 1990 Workshop on
DOI :
10.1109/NUPAD.1990.748276
