Title :
Merged Bipolar Transistor Models Including Substrate Current
Author :
Inohira, Susumu ; Shimni, T. ; Masuda, Hiroo ; Iida, Kyoichi
Author_Institution :
Hitachi, Ltd.
Keywords :
Analog circuits; Bipolar transistors; Circuit simulation; Diodes; Electrical resistance measurement; Epitaxial layers; Modems; Semiconductor process modeling; Substrates; Voltage;
Conference_Titel :
Numerical Modeling of Processes and Devices for Integrated Circuits, 1990. NUPAD III. 1990 Workshop on
DOI :
10.1109/NUPAD.1990.748281