Title :
Device Simulation Intending Small Scale Circuit Level Analysis
Author_Institution :
Toshiba Corporation
Keywords :
Analytical models; Boundary conditions; Capacitance; Circuit analysis; Circuit simulation; Conducting materials; Current density; Equations; Inverters; Jacobian matrices;
Conference_Titel :
Numerical Modeling of Processes and Devices for Integrated Circuits, 1990. NUPAD III. 1990 Workshop on
DOI :
10.1109/NUPAD.1990.748284
