Title :
An Adaptive Grid Refinement Strategy for the Drift-Diffusion
Author :
Bilrgler, J.F. ; Coughran, W.M. ; Fichtner, W.
Author_Institution :
Swiss Federal Inst. of Technology
Keywords :
Charge carrier processes; Code standards; Current density; Doping; Electrostatics; Finite wordlength effects; Monitoring; Nonlinear equations; Partial differential equations; Spontaneous emission;
Conference_Titel :
Numerical Modeling of Processes and Devices for Integrated Circuits, 1990. NUPAD III. 1990 Workshop on
DOI :
10.1109/NUPAD.1990.748288
