Title :
Comparison Between Drift-diffusion Model And Hydrodynamic Model For Sub-micron Mosfets
Author :
Oda, I. ; Kotani, N. ; Shirahata, M. ; Fujinaga, M. ; Akasaka, Y.
Author_Institution :
Mitsubishi Electric Corporation
Keywords :
Analytical models; Charge carrier processes; Electrons; Hydrodynamics; Large scale integration; MOSFETs; Poisson equations; Temperature distribution; Temperature sensors; Voltage;
Conference_Titel :
Numerical Modeling of Processes and Devices for Integrated Circuits, 1990. NUPAD III. 1990 Workshop on
DOI :
10.1109/NUPAD.1990.748292
