Title :
Stress-Strength Theory and Its Transformation into Reliability Functions
Author :
Tiger, B. ; Weir, K.
Author_Institution :
Radio Corporation of America, Defense Electronic Products, Camden, New Jersey
Keywords :
Data analysis; Gaussian distribution; Mathematical model; Reliability theory; Resonance; Safety devices; Temperature; Testing; Thermal stresses;
Conference_Titel :
Physics of Failure in Electronics, 1963. Second Annual Symposium on the
Conference_Location :
Chicago, IL, USA
DOI :
10.1109/IRPS.1963.362239
