DocumentCode
2597977
Title
Failure Mechanism in Silicon
Author
Mann, J.F. ; Sandler, N.P.
Author_Institution
Pacific Semiconductors, Inc., Lawndale, California
fYear
1963
fDate
Sept. 1963
Firstpage
145
Lastpage
153
Keywords
Boron; Capacitive sensors; Failure analysis; Genetic expression; Impurities; Lattices; Sandblasting; Semiconductor device reliability; Semiconductor devices; Silicon;
fLanguage
English
Publisher
ieee
Conference_Titel
Physics of Failure in Electronics, 1963. Second Annual Symposium on the
Conference_Location
Chicago, IL, USA
ISSN
0097-2088
Type
conf
DOI
10.1109/IRPS.1963.362242
Filename
4207593
Link To Document