DocumentCode

2597996

Title

Some Failure Mechanisms at Insulator-Conductor Junctions

Author

Shirn, G.A. ; Smyth, D.M.

Author_Institution

Research Center, Sprague Electric Company, North Adams, Massachusetts

fYear

1963

fDate

Sept. 1963

Firstpage

154

Lastpage

162

Keywords

Capacitors; Chemicals; Conductivity; Degradation; Dielectric materials; Dielectrics and electrical insulation; Electrodes; Failure analysis; Solids; Temperature;

fLanguage

English

Publisher

ieee

Conference_Titel

Physics of Failure in Electronics, 1963. Second Annual Symposium on the

Conference_Location

Chicago, IL, USA

ISSN

0097-2088

Type

conf

DOI

10.1109/IRPS.1963.362243

Filename

4207594