• DocumentCode
    2598064
  • Title

    III–V FET high frequency model with drift and depletion charges

  • Author

    Iwamoto, Mitsugu ; Xu, Jie ; Horn, J.M. ; Root, David E.

  • Author_Institution
    Agilent Technologies, Santa Rosa, United States
  • fYear
    2011
  • fDate
    5-10 June 2011
  • Firstpage
    1
  • Lastpage
    1
  • Abstract
    Summary form only given, as follows. A formulation of the III–V FET nonlinear charge model decomposed into a combination of univariate voltage depletion charges and a bivariate mixed voltage-current dependent “drift” charge is presented. Analogous to the diffusion charge in BJT models, the drift charge represents the mobile carriers in the channel of the FET. The total charge depends on the depletion capacitances, drain current, and transit time, which links the FET charge model directly to the physical operation of the device.
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Symposium Digest (MTT), 2011 IEEE MTT-S International
  • Conference_Location
    Baltimore, MD
  • ISSN
    0149-645X
  • Print_ISBN
    978-1-61284-754-2
  • Electronic_ISBN
    0149-645X
  • Type

    conf

  • DOI
    10.1109/MWSYM.2011.5973514
  • Filename
    5973514