Title :
III–V FET high frequency model with drift and depletion charges
Author :
Iwamoto, Mitsugu ; Xu, Jie ; Horn, J.M. ; Root, David E.
Author_Institution :
Agilent Technologies, Santa Rosa, United States
Abstract :
Summary form only given, as follows. A formulation of the III–V FET nonlinear charge model decomposed into a combination of univariate voltage depletion charges and a bivariate mixed voltage-current dependent “drift” charge is presented. Analogous to the diffusion charge in BJT models, the drift charge represents the mobile carriers in the channel of the FET. The total charge depends on the depletion capacitances, drain current, and transit time, which links the FET charge model directly to the physical operation of the device.
Conference_Titel :
Microwave Symposium Digest (MTT), 2011 IEEE MTT-S International
Conference_Location :
Baltimore, MD
Print_ISBN :
978-1-61284-754-2
Electronic_ISBN :
0149-645X
DOI :
10.1109/MWSYM.2011.5973514