DocumentCode
2598064
Title
III–V FET high frequency model with drift and depletion charges
Author
Iwamoto, Mitsugu ; Xu, Jie ; Horn, J.M. ; Root, David E.
Author_Institution
Agilent Technologies, Santa Rosa, United States
fYear
2011
fDate
5-10 June 2011
Firstpage
1
Lastpage
1
Abstract
Summary form only given, as follows. A formulation of the III–V FET nonlinear charge model decomposed into a combination of univariate voltage depletion charges and a bivariate mixed voltage-current dependent “drift” charge is presented. Analogous to the diffusion charge in BJT models, the drift charge represents the mobile carriers in the channel of the FET. The total charge depends on the depletion capacitances, drain current, and transit time, which links the FET charge model directly to the physical operation of the device.
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave Symposium Digest (MTT), 2011 IEEE MTT-S International
Conference_Location
Baltimore, MD
ISSN
0149-645X
Print_ISBN
978-1-61284-754-2
Electronic_ISBN
0149-645X
Type
conf
DOI
10.1109/MWSYM.2011.5973514
Filename
5973514
Link To Document