Title :
Failure Physics and Accelerated Testing
Author :
Bretts, G. ; Kozol, J. ; Lampert, H.
Author_Institution :
Spacecraft Department, General Electric Company, Philadelphia, Pennsylvania
Abstract :
ACCELERATED step-stress and constant stress tests of two types of film resistors have been analyzed by menas of a time-temperature parameter, based on Arrhenius type aging mechanisms. Correlation was made with physical degradation models of the resistor types. Estimates of time to failure can be made, based on typical environmental exposures. Degradation in planar transistors was found to be affected by random discontinuities, so that a similar correlation could not be made.
Keywords :
Aerospace electronics; Capacitors; Degradation; Electronic equipment testing; Life estimation; Life testing; Physics; Resistors; Space vehicles; Stress;
Conference_Titel :
Physics of Failure in Electronics, 1963. Second Annual Symposium on the
Conference_Location :
Chicago, IL, USA
DOI :
10.1109/IRPS.1963.362246
