DocumentCode
2598130
Title
The development of a test vehicle for applications in ambient electronic systems using very thin flexible substrate
Author
Majeed, B. ; Delaney, K. ; Barton, J. ; Razeeb, K.M. ; MacCarthy, N. ; O´mathuna, C.
Author_Institution
National Microelectron. Res. Inst., Univ. Coll. Cork, UK
fYear
2004
fDate
8-10 Dec. 2004
Firstpage
369
Lastpage
374
Abstract
In this work the development and characterisation of a very thin flexible substrate, with thickness ranging from 3 microns to 25 microns, was presented. The work analyses the stress generated in thin flexible substrate and determines the critical thickness to avoid wrinkling in the substrate. This substrate is then used to package test chips into a highly miniaturised 3D module. The 3D module consists of 4 IC\´s each having thickness of 50 microns and total module is approximately 450 microns in thickness and with a footprint of 18×7mm2. This module is being developed as a technological demonstrator for the "I-Seed". The I-seed is an NMRC envisioned distributed autonomous micromodule that would interact, respond and learn from its surroundings making integration of engineering, computer science and human intelligence a reality.
Keywords
distributed sensors; integrated circuit packaging; materials testing; multichip modules; substrates; 3 to 25 micron; I-Seed; NMRC; ambient electronic systems; critical thickness; distributed autonomous micromodule; integrated circuit packaging; miniaturised 3D module; test chips; test vehicle development; very thin flexible substrate; Assembly; Chip scale packaging; Electronic equipment testing; Electronics packaging; Hardware; Intelligent sensors; Sensor systems; System testing; Vehicles; Wafer scale integration;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronics Packaging Technology Conference, 2004. EPTC 2004. Proceedings of 6th
Print_ISBN
0-7803-8821-6
Type
conf
DOI
10.1109/EPTC.2004.1396636
Filename
1396636
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