Title :
Prediction of Functional Electronic Block Performance Through Localization of Malfunctions
Author :
Lytle, W.J. ; Merck, J.W. ; Dzimianski, J.W. ; Skinner, S.M.
Author_Institution :
Air Arm Division, Westinghouse Electric Corporation, Baltimore 3, Maryland
Keywords :
Contacts; Copper; Diodes; Fabrication; Geometry; Manufacturing; Microelectronics; Probes; Slabs; Solid state circuits;
Conference_Titel :
Physics of Failure in Electronics, 1963. Second Annual Symposium on the
Conference_Location :
Chicago, IL, USA
DOI :
10.1109/IRPS.1963.362248
