DocumentCode
2598176
Title
Burst Noise in Semiconductor Devices
Author
Card, W.Howard ; Mavretic, Anton
Author_Institution
Syracuse University, Syracuse, New York
fYear
1963
fDate
Sept. 1963
Firstpage
268
Lastpage
283
Keywords
Autocorrelation; Current measurement; Gaussian noise; Low-frequency noise; Magnetic noise; Noise measurement; Random processes; Semiconductor device noise; Semiconductor devices; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Physics of Failure in Electronics, 1963. Second Annual Symposium on the
Conference_Location
Chicago, IL, USA
ISSN
0097-2088
Type
conf
DOI
10.1109/IRPS.1963.362250
Filename
4207601
Link To Document