Title :
The Aging Mechanisms of Metal Film Resistors
Author :
Bohrer, John J. ; Lewis, Charles W.
Author_Institution :
International Resistance Company, Philadelphia 8, Pennsylvania
Keywords :
Aging; Conductivity; Electrical resistance measurement; Equations; Failure analysis; Geometry; Oxidation; Resistors; Temperature; Testing;
Conference_Titel :
Physics of Failure in Electronics, 1963. Second Annual Symposium on the
Conference_Location :
Chicago, IL, USA
DOI :
10.1109/IRPS.1963.362254
