DocumentCode

2598218

Title

The Aging Mechanisms of Metal Film Resistors

Author

Bohrer, John J. ; Lewis, Charles W.

Author_Institution

International Resistance Company, Philadelphia 8, Pennsylvania

fYear

1963

fDate

Sept. 1963

Firstpage

338

Lastpage

348

Keywords

Aging; Conductivity; Electrical resistance measurement; Equations; Failure analysis; Geometry; Oxidation; Resistors; Temperature; Testing;

fLanguage

English

Publisher

ieee

Conference_Titel

Physics of Failure in Electronics, 1963. Second Annual Symposium on the

Conference_Location

Chicago, IL, USA

ISSN

0097-2088

Type

conf

DOI

10.1109/IRPS.1963.362254

Filename

4207605