• DocumentCode
    2598323
  • Title

    A background amplifier offset calibration technique for high-resolution pipelined ADCs

  • Author

    Ding, Li ; Sin, Sai-Weng ; Seng-Pan, U. ; Martins, R.P.

  • Author_Institution
    Analog & Mixed Signal VLSI Lab., Univ. of Macau, Macao, China
  • fYear
    2010
  • fDate
    20-23 June 2010
  • Firstpage
    41
  • Lastpage
    44
  • Abstract
    This paper describes a novel offset calibration technique of the residue amplifier (RAMP) for pipelined ADCs. The calibration operates in two phases, completely in the background, without requiring any interruption in the operation of the ADC. In the analog coarse correction phase most of the offset is compensated through the injection of a DC signal at RAMP´s input. The digital fine correction phase will eliminate the remaining offset. Simulation results show that with the proposed calibration technique the over-range margin can be released and the SNDR is not degraded.
  • Keywords
    amplifiers; analogue-digital conversion; RAMP; SNDR; analog coarse correction phase; background amplifier offset calibration; digital fine correction phase; high-resolution pipelined ADC; residue amplifier; Calibration; Capacitors; Choppers; Converters; Mathematical model; Noise; Simulation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    NEWCAS Conference (NEWCAS), 2010 8th IEEE International
  • Conference_Location
    Montreal, QC
  • Print_ISBN
    978-1-4244-6806-5
  • Electronic_ISBN
    978-1-4244-6804-1
  • Type

    conf

  • DOI
    10.1109/NEWCAS.2010.5603728
  • Filename
    5603728