DocumentCode
2598393
Title
Failure Modes in Integrated and Partially Integrated Microelectronic Circuits
Author
Anderson, G.P. ; Erickson, R.A.
Author_Institution
UNIVAC, St. Paul, Minnesota
fYear
1963
fDate
Sept. 1963
Firstpage
498
Lastpage
524
Keywords
Consumer electronics; Costs; Environmental economics; Fabrication; Failure analysis; History; Integrated circuit technology; Materials reliability; Microelectronics; Reflection;
fLanguage
English
Publisher
ieee
Conference_Titel
Physics of Failure in Electronics, 1963. Second Annual Symposium on the
Conference_Location
Chicago, IL, USA
ISSN
0097-2088
Type
conf
DOI
10.1109/IRPS.1963.362264
Filename
4207615
Link To Document