DocumentCode

2598418

Title

Observations of the Physics of Failure of Semiconductor Devices by X-ray Radiography

Author

Silver, Ray L.

Author_Institution

Delco Radio Division, G.M.C., Kokomo, Indiana

fYear

1963

fDate

Sept. 1963

Firstpage

525

Lastpage

534

Keywords

Bonding; Breakdown voltage; Electric breakdown; Failure analysis; Physics; Prototypes; Radiography; Rectifiers; Semiconductor devices; Testing;

fLanguage

English

Publisher

ieee

Conference_Titel

Physics of Failure in Electronics, 1963. Second Annual Symposium on the

Conference_Location

Chicago, IL, USA

ISSN

0097-2088

Type

conf

DOI

10.1109/IRPS.1963.362265

Filename

4207616