Failure Modes in Naval Electronic Equipment

Author

Brun, J.H.

Author_Institution

Electronic Engineer, U. S. Naval Applied Science Laboratory, Naval Base Brooklyn 1, New York

fYear

1963

fDate

Sept. 1963

Firstpage

535

Lastpage

549

Keywords

Electronic equipment; Failure analysis; Fires; Laboratories; Maintenance; Manufacturing; Marine vehicles; Resistors; Stress; Temperature;

fLanguage

English

Publisher

ieee

Conference_Titel

Physics of Failure in Electronics, 1963. Second Annual Symposium on the

Conference_Location

Chicago, IL, USA

ISSN

0097-2088

Type

DOI

10.1109/IRPS.1963.362266

Filename

4207617

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