Title :
Failure Modes in Naval Electronic Equipment
Author_Institution :
Electronic Engineer, U. S. Naval Applied Science Laboratory, Naval Base Brooklyn 1, New York
Keywords :
Electronic equipment; Failure analysis; Fires; Laboratories; Maintenance; Manufacturing; Marine vehicles; Resistors; Stress; Temperature;
Conference_Titel :
Physics of Failure in Electronics, 1963. Second Annual Symposium on the
Conference_Location :
Chicago, IL, USA
DOI :
10.1109/IRPS.1963.362266
